Autocatalytic Coatings & Technology

Stapleton Technologies Inc.

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Cobalt-Nickel deposited into MOS Silicon for subsequent silicide formation to form the drain on discrete devices

Palladium Activation of Silicon for Ohmic contact

This process is a portion of a complete process that deposits a thin layer of cobalt-nickel onto the silicon, thermal anneal to form silicide in forming gas and then the deposition of nickel and gold to form the solderable surface.

This technology permits the manufacture of a number of different types of CMOS devices using low cost aqueous techniques to develop metalize the wafers with silicide Ohmic contacts, eliminating aluminum and the vacuum requirements of conventional processing.

Nickel gold deposit after silicide formation on bare silicon.

Phone: 562-437-0541

Fax: 562-437-8632

E-mail: info@stapletontech.com

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Sequence 1042-1043

Process Materials

Process

Description

Technical Data Sheet

Material Safety Data Sheet

MICRO 209

Cleaner, TMAH

MICRO 209  DS

MICRO 209 MSDS

MICRO 210

Cleaner, Organic Acid

MICRO 210  DS

MICRO 210 MSDS

MICRO 212

Cleaner, Organic Acid + HF

MICRO 212 DS

MICRO 212 MSDS

MICRO 214

Palladium Activation

MICRO 214  DS

MICRO 214 MSDS

MICRO 275

Autocatalytic Cobalt-Nickel

MICRO 275 DS

MICRO 275 MSDS

MICRO 282

Autocatalytic Nickel

MICRO 282  DS

MICRO 282 MSDS

MICRO 290

Immersion Gold

MICRO 290  DS

MICRO 290 MSDS

MICRO 291

Hybrid Autocatalytic Gold

MICRO 291  DS

MICRO 291 MSDS